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Cascade Microtech / Non-contact wafer testing / Semiconductor device fabrication / Probe card / Wafer testing


Microsoft PowerPoint - T00_01_Mann.ppt
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Document Date: 2009-12-22 22:52:47

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File Size: 2,83 MB

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Company

IBM / /

IndustryTerm

cantilever technology / /

Organization

ITC Program Committee Advisory Board / /

Person

William Mann / /

Position

Chair / Southwest Test Workshop / /

Technology

semiconductor / Contactor Technology / Probe Cards / Card Extends cantilever technology / /

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