Typical device / test systems / measurement equipment / laser diode manufacturing / diode manufacturing test processes / telecommunications application / simpler and less costly test systems / telecommunications industry / metal diffusion / manufacturing burn / electronic devices / much simpler and less costly test systems / manufacturing cost / manufacturing / decades equipment / defective devices / life test systems / activation energy / sample audit / manufacturing process / battery backup systems / /
Person
Median Lifetime (Hrs) / Franklin R. Nash / Voltage (V) Optical / /
Position
Author / President and CEO / TESTING Lawrence A. Johnson President / CEO / Forward / /
Laser Diode Burn-In and Reliability Testing