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Materials science / Scanning electron microscope / Electron beam / Electron microscope / Microscope / Electron backscatter diffraction / Microscopy / Cathodoluminescence / Characterization / Scientific method / Science / Electron microscopy


Introductory Scanning Electron Microscopy Training at CharFac
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Document Date: 2013-11-27 02:03:06


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File Size: 23,65 KB

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Company

Hitachi / /

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IndustryTerm

high resolution imaging / high resolution backscatter imaging / high magnification/resolution imaging / /

Person

Bob Hafner / Chris Frethem / /

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Technology

Spectroscopy / /

URL

http /

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