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Electricity / Physical quantities / Microstrip / Transmission line / Characteristic impedance / Capacitance / Scattering parameters / Electromagnetism / Electronic engineering / Electronics


Accurate Characteristic Impedance Measurement on Silicon Dylan F. Williams National Institute of Standards and Technology, 325 Broadway, Boulder, CO[removed]Ph: [+[removed]Fax: [+[removed]E-mail: dylan@boul
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Document Date: 2010-07-20 13:22:52


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City

Eisenstadt / /

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Facility

Silicon Dylan F. Williams National Institute of Standards and Technology / /

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IndustryTerm

ground metal / wide metal rails / /

Organization

National Institute of Standards and Technology / Hartmut Grabinski Universität Hannover / /

Person

Hartmut Grabinski Universität / Uwe Arz / /

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Position

microstrip center conductor / wide center conductor / equivalent circuit model for the contact pads and impedance transformer / center conductor / conductor / /

ProgrammingLanguage

Dylan / /

ProvinceOrState

Colorado / /

Technology

Microwave / broadband / /

SocialTag