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Microscopy / Electron microscope / Focused ion beam / Materials science / Centre for Advanced Microscopy / Ernst Ruska-Centre / Scientific method / Electron microscopy / Science


Carnegie Mellon Materials Science and Engineering Seminar Series Robert Sinclair Department of Metallurgy and Mining Engineering Stanford University
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Document Date: 2007-04-10 10:10:46


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Company

Stanford Nanocharacterization Laboratory / /

Country

United Kingdom / /

Facility

Stanford Nanocharacterization Laboratory / Cambridge University / Baker Hall / University of California / Mining Engineering Stanford University / Stanford University / /

IndustryTerm

semiconductor technology / chemical reaction / semiconductor devices / /

Organization

Cambridge University / University of California / Berkeley / National Academy of Sciences / Carnegie Mellon Materials Science and Engineering Seminar Series Robert Sinclair Department of Metallurgy / Department of Materials Science and Engineering / Stanford University / /

Person

Robert Sinclair / /

Position

postdoctoral researcher / Director / Professor and Chair / /

ProvinceOrState

California / /

SportsLeague

Stanford University / /

Technology

semiconductor / semiconductor technology / semiconductor devices / /

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