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Digital media / Chipkill / Dynamic random-access memory / RAM parity / Soft error / DIMM / CPU cache / Error detection and correction / DDR3 SDRAM / Computer memory / Computer hardware / Computing


LOT-ECC: LOcalized and Tiered Reliability Mechanisms for Commodity Memory Systems ∗ Aniruddha N. Udipi† † Naveen Muralimanohar‡
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Document Date: 2012-07-05 23:25:37

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File Size: 394,10 KB

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