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Electronic engineering / Soft error / Dynamic random-access memory / ECC memory / 1T-SRAM / Memory scrubbing / RAM parity / Chipkill / Error detection and correction / Computer memory / Computer hardware / Electronics


Document Date: 2006-01-16 16:26:40

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City

Denver / Naperville / /

Company

MoSys / CMOS Complementary Metal Oxide Semiconductor / IBM / Texas Instruments / Tezzaron Semiconductor / Cisco Systems / /

Currency

AMD / /

IndustryTerm

manufacturing / memory chips / energy / /

Organization

ASIC / National Aeronautics and Space Administration / DED / U.S. Securities and Exchange Commission / /

Product

Olympus E-3 Digital Camera / /

ProvinceOrState

Manitoba / Illinois / /

PublishedMedium

The NASA ASIC Guide / /

Technology

alpha / radiation / MEMORY TECHNOLOGY / RAM / ASIC / http / SDRAM / Gigabit / 0.13-micron technologies / Random Access / simulation / SRAM / html / memory chips / pdf / /

URL

http /

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