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Field-programmable gate array / Systems theory / Xilinx / Fault detection and isolation / Pareto efficiency / Group testing / Fault / General Confederation of Labour / C / Computing / Control theory / Electronic engineering


Performance Evaluation of Two Allocation Schemes for Combinatorial Group Testing Fault Isolation Rawad N. Al-Haddad, Carthik A. Sharma, and Ronald F. DeMara School of Electrical Engineering and Computer Science Universit
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Document Date: 2007-06-28 12:14:16

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File Size: 75,05 KB

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City

Puerto Vallarta / /

Company

World Scientific / /

Country

Mexico / /

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Event

Product Issues / /

Facility

Computer Science University of Central Florida Orlando / /

IndustryTerm

dependable systems / /

Organization

University of Central Florida / Combinatorial Group Testing Fault Isolation Rawad N. Al-Haddad / Carthik A. Sharma / and Ronald F. DeMara School of Electrical Engineering / Computer Science University / Electrical Engineering and Computer Science University / /

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Position

Application Programmer / /

Product

The Fault Injection / resource / LUT / resources / /

ProgrammingLanguage

FL / Python / /

ProvinceOrState

Florida / /

Region

Central Florida / /

Technology

encryption / FPGA / radiation / testing algorithms / N/R. The CGT-based algorithm / CGT algorithm / VHDL / implemented using VHDL / /

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