![Electronics / Compound semiconductors / Inorganic compounds / Semiconductor device fabrication / Materials science / Reliability / Light-emitting diode / Hot carrier injection / Gallium nitride / Chemistry / Electronic engineering / Semiconductors Electronics / Compound semiconductors / Inorganic compounds / Semiconductor device fabrication / Materials science / Reliability / Light-emitting diode / Hot carrier injection / Gallium nitride / Chemistry / Electronic engineering / Semiconductors](https://www.pdfsearch.io/img/b950668d81dca573f509a897a090a949.jpg)
| Document Date: 2011-06-08 19:34:02 Open Document File Size: 29,41 KBShare Result on Facebook
Company RF Compound Semiconductor / / / Facility University Research Initiative / / IndustryTerm device technologies / high yield manufacturing / reliability applications / compound semiconductor devices / chemical imaging / weapon systems / state technologies / hot carrier / low-activation-energy mechanisms / lowactivation-energy mechanisms / technology insertion / / Organization IEEE Reliability Society / office of Naval Research / Air Force Office / Department of Defense / Naval Postgraduate School / / Person Kitt Reinhardt / Donald Silversmith / Paul Maki / / / Position Topic Chief / Silversmith / Deputy Under Secretary / Secretary of Defense for Research and Engineering / / Technology Spectroscopy / thermography / semiconductors / III-V technologies / device technologies / Semiconductor devices / dielectric / state technologies / / URL www.onr.navy.mil/sci_tech/3t/corporate/docs/muri_08_baa.doc / /
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