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Logic gates / Digital electronics / Electronic design / XOR gate / XNOR gate / Stuck-at fault / Fault model / Transistor fault / OR gate / Fault tolerance / Pass transistor logic / Exclusive or


Proceedings of the International MultiConference of Engineers and Computer Scientists 2012 Vol II, IMECS 2012, March, 2012, Hong Kong A Concurrent Error Detection Based FaultTolerant 32 nm XOR-XNOR Circuit Implem
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Document Date: 2013-12-16 08:28:43

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File Size: 611,61 KB

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