Cryogenic probe station for on-wafer characterization of electrical devices Damon Russell, Kieran Cleary, and Rodrigo Reeves Citation: Review of Scientific Instruments 83, [removed]); doi: [removed] View onlin

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Date: 2014-05-16 16:39:51 Chemistry Cryostat Microwave Scattering parameters Cryocooler Mechanical probe station Thermal conductivity Cryogenics Technology Thermodynamics		Cryogenic probe station for on-wafer characterization of electrical devices Damon Russell, Kieran Cleary, and Rodrigo Reeves Citation: Review of Scientific Instruments 83, [removed]); doi: [removed] View onlin Document is deleted from original location. Use the Download Button below to download from the Web Archive. Download Document from Web Archive File Size: 1,91 MB

Document is deleted from original location. Use the Download Button below to download from the Web Archive.