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Characteristic-Impedance Measurement Error on Lossy Substrates Dylan F. Williams National Institute of Standards and Technology, 325 Broadway, Boulder, CO[removed]Ph: [+[removed]Fax: [+[removed]E-mail: dyla
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Document Date: 2001-07-02 17:51:12

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File Size: 226,33 KB

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City

Eisenstadt / /

Company

Automatic RF Techniques Group / /

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Facility

Lossy Substrates Dylan F. Williams National Institute of Standards and Technology / /

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IndustryTerm

metal / level metal / silicon technologies / /

Organization

National Institute of Standards and Technology / Hartmut Grabinski Universität Hannover / /

Person

Wojciech Wiatr / N.Fel / V / A.C. Byers / V / Uwe Arz / Hartmut Grabinski Universität / /

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Position

wide signal conductor / conductor / /

ProgrammingLanguage

Dylan / R / /

ProvinceOrState

Colorado / /

Technology

Microwave / CMOS technology / broadband / silicon technologies / dielectric / /

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