P. Pappas2 1 2 Sandia National Laboratories / Ge / AIP Publishing LLC / NIST Ion Storage Group / Siemens / /
Country
Germany / Switzerland / United States / /
Currency
pence / USD / / /
Facility
USA National Institute of Standards and Technology / National Institute of Standards / Karlsruhe Institute of Technology / Massachusetts Institute of Technology / /
IndustryTerm
subsequent metal electroforming / out-gas / energy / metal / stainless-steel ring / e-beam / /
Organization
Physikalisches Institut / Center for Functional Nanostructures / MIT / Albert-Ludwigs-Universität Freiburg / USA National Institute of Standards and Technology / Institute of Technology / /
Person
D. Leibfried / C. A. Sackett / J. Sterk / D. J. Wineland / N. Shiga / Robert Jördens / R. Ozeri / David J. Wineland / F. Diedrich / Dietrich Leibfried / R. Jördens / Nat / Adam M. Rowen / Yves Colombe / Ulrich Warring / Andrew C. Wilson / W. Wang / D. J. Berkeland / J. D. Williams / J. D. Jost / Andrew E. Hollowell / M. A. Rowe / C. Langer / D. P. Pappas / W. K. Hensinger / E. Knill / Christian L. Arrington / Patrick Finnegan / D. Stick / Dustin A. Hite / Martin Weides / J. D. Miller / D. M. Meekhof / W. M. Itano / B. E. King / John D. Jost / Jonathan J. Coleman / S. Olmschenk / J. Wineland / K. S. McKay / C. S. Wood / G. Leuchs / David P. Pappas / J. C. Bergquist / C. Monroe / D. Jost / Kyle S. McKay / J. Britton / /
Position
D. J. / King / /
ProgrammingLanguage
DC / /
ProvinceOrState
New Mexico / Massachusetts / Colorado / /
PublishedMedium
Review of Scientific Instruments / /
Technology
information technology / microwave / lithography / laser system / laser / lasers / spectroscopy / /
Micro-fabricated stylus ion trap Christian L. Arrington, Kyle S. McKay, Ehren D. Baca, Jonathan J. Coleman, Yves Colombe, Patrick Finnegan, Dustin A. Hite, Andrew E. Hollowell, Robert Jördens, John D. Jost, Dietrich Lei