C 2013 AIP Publishing LLC / IOP Publishing / Thin Solid Films / TC / /
Country
United States / /
Currency
USD / / /
Facility
National Institute of Standards and Technology / Saint Louis University / Keck Institute / California Institute of Technology / /
IndustryTerm
gas loading / metal / sputter tool / astronomical applications / important applications / uneven nitrogen gas flow / normal metal / detector applications / gas flows / astronomical and other applications / similar energy resolution / e-print / multilayer devices / level systems / energy resolution / resonator devices / energy resolving power / /
Organization
National Institute of Standards and Technology / California Institute of Technology / USA Department of Physics / National Aeronautics and Space Administration / Keck Institute for Space Studies / Saint Louis University / /
Person
Michael R. Vissers / Martin Weides / Kent D. Irwin / Shannon M. Duff / Henry Leduc / David S. Wisbey / Martin Sandberg / David P. Pappas / Jonas Zmuidzinas / /
Proximity-coupled Ti/TiN multilayers for use in kinetic inductance detectors Michael R. Vissers, Jiansong Gao, Martin Sandberg, Shannon M. Duff, David S. Wisbey, Kent D. Irwin, and David P. Pappas Citation: Applied Physi