White Paper Accelerating 20nm Double Patterning Verification with IC Validator Author

First Page		Document Content
Date: 2014-11-07 14:30:50 Design closure Signoff Multiple patterning Physical design Dermatopontin Standard cell DPT vaccine Validator Application-specific integrated circuit Electronic engineering Electronic design automation Design rule checking		White Paper Accelerating 20nm Double Patterning Verification with IC Validator Author Add to Reading List Source URL: www.synopsys.com Download Document from Source Website File Size: 1,08 MB Share Document on Facebook

	The GPars Quick Reference The Whole GPars Team <> Version 1.2.1, Table of Contents Actor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . DocID: 1rsBb - View Document
	Datasheet SpyGlass DFT ADV RTL Testability Analysis and Improvement Overview DocID: 1qIXV - View Document
	The Impact of Unionization on Establishment Closure: A Regression Discontinuity Analysis of Representation Elections* John DiNardo David S. Lee DocID: 1p3cV - View Document
	Evaluating the Design of the R Language Objects and Functions For Data Analysis Flor´eal Morandat Brandon Hill DocID: 1lBZ3 - View Document
	Vivado Design Suite Tool Flow FPGA 1 FPGA-VDF-ILT (v1.0) Course Specification DocID: 1fTEk - View Document