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Electronic design / Chenming Hu / Phil Kaufman Award / BSIM / Multigate device / Transistor model / IEEE Council on Electronic Design Automation / Design Automation Conference / Design Automation and Test in Europe / Electronic engineering / Electrical engineering / Electronic design automation
Date: 2013-04-30 04:12:39
Electronic design
Chenming Hu
Phil Kaufman Award
BSIM
Multigate device
Transistor model
IEEE Council on Electronic Design Automation
Design Automation Conference
Design Automation and Test in Europe
Electronic engineering
Electrical engineering
Electronic design automation

NEWS RELEASE For more information, contact: Kristin Steen Public Relations for the IEEE Council on EDA[removed]

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