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Electronic engineering / Digital-to-analog converter / Analog-to-digital converter / Sampling / Spurious-free dynamic range / Differential nonlinearity / Quantization error / Effective number of bits / Signal-to-noise ratio / Digital signal processing / Electronics / Electromagnetism
Date: 2008-03-03 15:23:27
Electronic engineering
Digital-to-analog converter
Analog-to-digital converter
Sampling
Spurious-free dynamic range
Differential nonlinearity
Quantization error
Effective number of bits
Signal-to-noise ratio
Digital signal processing
Electronics
Electromagnetism

P1658 Digital to Analog Standard Meeting, February 21, 2008 Attendees: Steve Tilden, Texas Instruments (Chair) [removed] Robert Graham, Sandia National Labs., Albuquerque, NM USA [removed]

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