![Analog-to-digital converter / Integral nonlinearity / LTX / Differential nonlinearity / Static testing / David / Technology / Nevi\'im / Bible / Digital signal processing / Electronic circuits / Digital-to-analog converter Analog-to-digital converter / Integral nonlinearity / LTX / Differential nonlinearity / Static testing / David / Technology / Nevi\'im / Bible / Digital signal processing / Electronic circuits / Digital-to-analog converter](https://www.pdfsearch.io/img/330d84fad671a6cc1d00babe289786a8.jpg) Date: 2007-11-07 21:08:21Analog-to-digital converter Integral nonlinearity LTX Differential nonlinearity Static testing David Technology Nevi\'im Bible Digital signal processing Electronic circuits Digital-to-analog converter | | P1658 Digital to Analog Standard Meeting, October 16, 2007 Hosted by LTX Corporation, Norwood, MA Modified: 7-November-2007 Attendees: Steve Tilden, Texas Instruments (Chair)
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