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Diffraction / Crystallography / Diffraction topography / Imaging / X-ray / Scientific method / Physics / Science


X-Ray Topography 0.5 mm David R. Black
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Document Date: 2005-03-08 09:14:13

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File Size: 1,11 MB

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City

Washington / DC / /

Company

Engineering Laboratory OF CO / /

Country

United States / /

Facility

National Institute of Standards and Technology / Technology National Institute of Standards and Technology Arden L. Bement / Engineering Laboratory OF CO ENT MM TM E RI IT D E UN / /

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IndustryTerm

technological applications / diverse applications / /

Organization

National Institute of Standards and Technology / NSPUE2 U.S. GOVERNMENT PRINTING OFFICE WASHINGTON / Technology Administration / United Nations / Institute of Standards and Technology Arden L. Bement / U.S. Department of Commerce / /

Person

Bruce Steiner / Phillip J. Bond / Masao Kuriyama / Gabrielle G. Long / Richard Spal / Donald L. Evans / Ray Topography David / Ronald Dobbyn / Ray Topography vi / William Boettinger / Ray Topography / Harold Burdette / Ray Topography iv / David R. Black / Arden L. Bement / Jr. / /

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Position

Secretary for Technology / Secretary / Director / Superintendent / /

ProgrammingLanguage

DC / /

Technology

radiation / X-Ray / /

SocialTag