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Date: 2015-07-18 01:30:09Electronic engineering Negative-bias temperature instability Semiconductor device fabrication Digital electronics Integrated circuits Electronic design Prognostics Threshold voltage Battery MOSFET Field-effect transistor CMOS | RGNBTI PRODUCT BRIEF E N G I N E E R I N G I N N O V A T I O NAdd to Reading ListSource URL: www.ridgetopgroup.comDownload Document from Source WebsiteFile Size: 635,10 KBShare Document on Facebook |
Exploring Adaptive Reconfiguration to Optimize Energy Efficiency in Large-Scale Battery Systems Liang He1 , Lipeng Gu2 , Linghe Kong1, Yu Gu1 , Cong Liu3 , Tian He4 1 Singapore University of Technology and Design, SingapDocID: 1xVIH - View Document | |
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