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Electronic engineering / Negative-bias temperature instability / Semiconductor device fabrication / Digital electronics / Integrated circuits / Electronic design / Prognostics / Threshold voltage / Battery / MOSFET / Field-effect transistor / CMOS
Date: 2015-07-18 01:30:09
Electronic engineering
Negative-bias temperature instability
Semiconductor device fabrication
Digital electronics
Integrated circuits
Electronic design
Prognostics
Threshold voltage
Battery
MOSFET
Field-effect transistor
CMOS

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