TI Semiconductor Group / DMD / Texas Instruments / Microelectronic Systems / CMOS Metal / / /
Event
Reorganization / Force Majeure / / /
IndustryTerm
metal etches / test devices / test equipment / pixel metal depositions / metal creep / given device / Gross processing errors / sufficient thermal energy / microelectromechanical systems / thermal energy / superstructure processing / digital processing / thermal management / optical test equipment / energy / metal / diverse products / mechanical energy / stored energy / fundamental chemical degradation / chemical properties / radiant energy / electronics / residual gas analysis / actual applications / stores energy / creative and innovative solutions / control devices / chemical interaction / /
Organization
Packaging Society / Texas Instruments Digital Imaging Team / Congress / Post Office / / /
Lifetime Estimates and Unique Failure Mechanisms of the Digital Micromirror Device (DMD) M.R. Douglass Texas Instruments, Digital Imaging Post Office Box[removed], MS 8477 Plano, Texas 75086