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Chemistry / Atomic force microscopy / Microscopy / Scanning tunneling microscope / Microscope / Force spectroscopy / Dip-pen nanolithography / Magnetic force microscope / Vibrational analysis with scanning probe microscopy / Scanning probe microscopy / Science / Scientific method


Microsoft Word - 1_Lab_Unit_IntroSFM.doc
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Document Date: 2009-07-20 14:30:44

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File Size: 404,03 KB

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Company

IBM / /

Country

Switzerland / /

Facility

Navigator bar / /

IndustryTerm

contact mode imaging / cantilever alignment chip / force measuring tool / start imaging / topographical imaging mode / surface imaging technique / /

NaturalFeature

mount SFM / /

OperatingSystem

Microsoft Vista / /

Organization

LAB UNIT / Applied Force / Scanning Force Microscopy LAB UNIT / /

Person

Gerd Binnig / Calvin Quate / Christoph Gerber / Heinrich Rohrer / Mode As / Stanford Univeristy / /

/

Position

General / lab assistant / Controller / Z-Controller / /

Technology

spectroscopy / laser / lasers / cantilever alignment chip / /

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