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Chemistry / Nanotechnology / Magnetic force microscope / Atomic force microscopy / Cantilever / Focused ion beam / Microscopy / Scanning joule expansion microscopy / Thermal Probe Lithography / Scientific method / Scanning probe microscopy / Science


IEEE TRANSACTIONS ON MAGNETICS, VOL. 38, NO. 5, SEPTEMBER[removed]The CantiClever: A Dedicated Probe for Magnetic Force Microscopy
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Document Date: 2011-08-28 10:51:13


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City

New York / /

Company

McGraw-Hill / /

Country

Netherlands / /

Currency

USD / /

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Facility

University of Twente / MESA Research Institute / /

IndustryTerm

contact imaging / measurement tool / ion-beam equipment / batch manufacturing process / magnetic imaging / reproducible batch manufacturing process / conventional manufacturing techniques / thin film media / serial manufacturing process / mode control electronics / manufacturing process / reproducible manufacturing process / /

Organization

University of Twente / MESA Research Institute / /

Person

S. Porthun / S. McVitie / J. L. Vellekoop / J. C. Lodder / Iwan Heskamp / Leon Abelmann / J. N. Chapman / L. J. Heyderman / Cock Lodder Abstract / M. Siekman / G. N. Phillips / H. J. Hug / Force Microscopy Arnout van den Bos / A. B. Johnston / Martin Siekman / L. Abelmann / /

Position

G. P. / /

Technology

lithography / Digital Object Identifier / photolithography / using electron beam lithography / defined using photolithography / /

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