<--- Back to Details
First PageDocument Content
Science / Scientific method / Materials science / Atomic force microscopy / Nanometrology / Thermal Probe Lithography / Nanotechnology / Scanning probe microscopy / Emerging technologies
Date: 2015-03-03 22:03:52
Science
Scientific method
Materials science
Atomic force microscopy
Nanometrology
Thermal Probe Lithography
Nanotechnology
Scanning probe microscopy
Emerging technologies

IBM Scientists Effectively Eliminate Wear at the Nanoscale

Add to Reading List

Source URL: phys.org

Download Document from Source Website

File Size: 26,80 KB

Share Document on Facebook

Similar Documents

PDF Document

DocID: 1xDzM - View Document

INSTITUTE OF PHYSICS PUBLISHING  NANOTECHNOLOGY Nanotechnology–36

INSTITUTE OF PHYSICS PUBLISHING NANOTECHNOLOGY Nanotechnology–36

DocID: 1vnD2 - View Document

A WorkFlow Management System for Bioinformatics Grid Giovanni Aloisio, Massimo Cafaro, Sandro Fiore, Maria Mirto Center for Advanced Computational Technologies/ISUFI and National Nanotechnology Lab/INFM&CNR, Italy {giova

A WorkFlow Management System for Bioinformatics Grid Giovanni Aloisio, Massimo Cafaro, Sandro Fiore, Maria Mirto Center for Advanced Computational Technologies/ISUFI and National Nanotechnology Lab/INFM&CNR, Italy {giova

DocID: 1vk8n - View Document

Semi-Holistic Approach to Ensure Safe Implementation of Nanotechnology S. Resch1, C. Schimpel1, P. Maclean Obene2 and A. Falk1* BioNanoNet Forschungsgesellschaft mbH, Graz, Austria 2 Precision Varionic International Ltd,

Semi-Holistic Approach to Ensure Safe Implementation of Nanotechnology S. Resch1, C. Schimpel1, P. Maclean Obene2 and A. Falk1* BioNanoNet Forschungsgesellschaft mbH, Graz, Austria 2 Precision Varionic International Ltd,

DocID: 1viM8 - View Document

Press Release Tel: Fax: Engine for Nanotechnology  TM

Press Release Tel: Fax: Engine for Nanotechnology TM

DocID: 1vcYW - View Document