![Chemistry / Atomic force microscopy / Microscopy / Scanning tunneling microscope / Microscope / Force spectroscopy / Dip-pen nanolithography / Magnetic force microscope / Vibrational analysis with scanning probe microscopy / Scanning probe microscopy / Science / Scientific method Chemistry / Atomic force microscopy / Microscopy / Scanning tunneling microscope / Microscope / Force spectroscopy / Dip-pen nanolithography / Magnetic force microscope / Vibrational analysis with scanning probe microscopy / Scanning probe microscopy / Science / Scientific method](https://www.pdfsearch.io/img/4dae423b11b53ea9a175274129c40821.jpg)
| Document Date: 2009-07-20 14:30:44 Open Document File Size: 404,03 KBShare Result on Facebook
Company IBM / / Country Switzerland / / Facility Navigator bar / / IndustryTerm contact mode imaging / cantilever alignment chip / force measuring tool / start imaging / topographical imaging mode / surface imaging technique / / NaturalFeature mount SFM / / OperatingSystem Microsoft Vista / / Organization LAB UNIT / Applied Force / Scanning Force Microscopy LAB UNIT / / Person Gerd Binnig / Calvin Quate / Christoph Gerber / Heinrich Rohrer / Mode As / Stanford Univeristy / / / Position General / lab assistant / Controller / Z-Controller / / Technology spectroscopy / laser / lasers / cantilever alignment chip / /
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