![](https://www.pdfsearch.io/img/8573761a6862b5f21d4d15aaeeb8c4be.jpg) Date: 2016-08-22 14:30:22
| | Veena Misra Professor of Electrical and Computer Engineering North Carolina State University Optimizing Performance and Reliability of GaN MOSFET Devices Owing to a high critical electric field and high electron mobilityAdd to Reading ListSource URL: www.apec-conf.orgDownload Document from Source Website File Size: 209,03 KBShare Document on Facebook
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