<--- Back to Details
First PageDocument Content
Physical optics / Reflection / Wave / Total internal reflection / Light / Wave mechanics / Ripple tank / Colours of a soap film / Optics / Physics / Geometrical optics
Date: 2009-11-19 02:06:33
Physical optics
Reflection
Wave
Total internal reflection
Light
Wave mechanics
Ripple tank
Colours of a soap film
Optics
Physics
Geometrical optics

Add to Reading List

Source URL: www.schoolphysics.co.uk

Download Document from Source Website

File Size: 55,50 KB

Share Document on Facebook

Similar Documents

Spreadsheet / Total internal reflection fluorescence microscope

GSR/TIRF REQUEST PROCEDUREContact Person Faculty Member Ph.D. Coordinator

DocID: 1qKWG - View Document

Microscopy / Microbiology / Microscopes / Scientific method / Biology / Confocal microscopy / Two-photon excitation microscopy / Total internal reflection fluorescence microscope / Fluorescence microscope / Nikon Instruments

Questionaire: UE, 1 std.  Live imaging course 2016 Summer Term  (Studienprogrammleitung Biologie)

DocID: 1pVRm - View Document

Microscopy / Microscopes / Laboratory techniques / Laboratory equipment / Confocal microscopy / Two-photon excitation microscopy / Total internal reflection fluorescence microscope / Fluorescence microscope / Draft:H. Kumar Wickramasinghe / Nikon Instruments

Questionaire: UE, 1 std.  Live imaging course 2016 Summer Term  (Studienprogrammleitung Biologie)

DocID: 1pkrI - View Document

Microscopy / Microscopes / Fluorescence microscope / Optical microscope / Total internal reflection fluorescence microscope / STED microscopy / Fluorescence correlation spectroscopy

CALL FOR PHD POSITIONS Department/Institute: Institute of Applied Physics (APH) Research Field: Optics and Photonics/ Fluorescence Imaging/ Biophysics Contact person/Mail address: Prof. Dr. G. U. Nienhaus, Institute of A

DocID: 1pfkT - View Document

Total Internal Reflection Microscopy TIRM is a optical technique for monitoring the instantaneous separation distance between a microscopic sphere and a flat plate. Changes in distance as small as 1 nm can be detected. T

DocID: 1lOs1 - View Document