Leuven / San Francisco / Alexandria / Toulouse / Chicago / Volendam / Yokohama / /
Company
Large Storage Systems / Large Archival Storage Systems / /
Country
Belgium / France / Japan / United States / Netherlands / /
Currency
USD / / /
Event
Product Issues / /
Facility
Computer Science University of Houston Houston / Computer Science University of California Santa Cruz / University of California / /
IndustryTerm
media errors / storage systems / manufacturing batch / optimum algorithm / insurance policy / /
Organization
RAID / Darrell D. E. Long Department / National Science Foundation / University of California / Berkeley / Computer Science University of California Santa Cruz / Computer Science University of Houston Houston / RAID Organization / /
Person
Darrell D. E. Long / / /
Position
given model for the occurrence batch-correlated failures / controller / /
Using Device Diversity to Protect Data against Batch-Correlated Disk Failures Jehan-François Pâris *