Kokubunji / Santa Barbara / Aurrion / Tokyo / Hsinchu / Eindhoven / Vancouver / Sciamanna Supélec Metz / Surrey / Würzburg / Pasadena / Daejeon / Washington / DC / Zurich / Davos / Haifa / Sb / Cambridge / Los Angeles / Garching / San Diego / West North Logan / Orlando / Burnaby / /
Company
CO2 and CO / Jet Propulsion Laboratory / Hewlett Packard / Katsuyama Kouji Nakahara Atsushi Yamaguchi Sumitomo Electric Industries Ltd. / OptiGrate Corporation / Crosslight Software Inc. / Naval Research Laboratory / Thermo Fisher Scientific / Norbert Lichtenstein Oclaro Switzerland GmbH / USA Semiconductor / Yuichi Tohmori NTT Electronics Corporation / Diodes / US Naval Research Laboratory / Hyundai / Maxion Technologies Inc. / Dave Bour Jerry R. Meyer ePowersoft Inc. / San Diego Intense Photonics Ltd. / USA Chung-En Zah Corning Inc. / P. R. A. Binetti / Hee Lee Tsuyoshi Yamamoto KAIST Fujitsu Laboratories Ltd. / Achray Photonics Ophir-Spiricon LLC / Infrared Laser Based Trace Gas Sensor Technologies / Ge / Sotera Defense Solutions / Chung-En Zah nLight Corporation / Intraband LLC / Sandia National Laboratories / Newport Corporation / AdTech Optics Inc. / Corning Inc. / Ishimura Yi Luo Yoshiaki Nakano Mitsubishi Electric Corporation / Hitachi Ltd. / Innovative Photonic Solutions / Intel / LEO LI Crosslight Software Inc / VADIM SMIRNOV OptiGrate Corporation / K2J 4P4 Canada Ophir-Spiricon LLC / /
Continent
Europe / Americas / Africa / /
Country
Switzerland / Netherlands / Japan / United Kingdom / Scotland / Wales / Germany / Belgium / United States / Canada / / /
Event
Business Partnership / /
Facility
UK Andrea Fiore Cristina Masoller Peter P. Vasil’ev Eindhoven University of Technology Universidad Politecnica de Cataluña PN Lebedev University Eindhoven / C. S. Kim¸ US Naval Research Laboratory / Inc. US Naval Research Laboratory / Canada Mario Dagenais University of Maryland College Park / Tokyo Institute of Technology / Cardiff University / Chung Wang Australian National University Tokyo Institute of Techology Canberra / SPAIN Richard V. Penty Nicolas Grandjean University of Cambridge École Polytechnique Fédérale de Lausanne Cambridge / Stony Brook University / Laboratory Lexington / Gary Evans Southern Methodist University / USA Fumio Koyama Xuezhe Zheng Tokyo Institute of Technology Oracle Yokohama / JAPAN National Chiao Tung University / University of Tokyo / USA Constance J. Chang-Hasnain Clifton G. Fonstad Jerry R. Meyer University of CaliforniaBerkeley Massachusetts Institute of Technology / Kent Choquette University of Illinois Urbana Champaign Urbana / British Columbia Rose-Hulman Institute of Technology Vancouver / California Institute of Technology / University of California / USA Lukas Chrostowski Paul O. Leisher University / University of Notre Dame / Eindhoven University of Technology / Nottingham Court / Walter Schottky Institute / USA Luke J. Mawst University of WisconsinMadision Madison / Ltd. Kanazawa Institute of Technology Kokubunji / Swiss Federal Institute of Technology Zurich / Hall Sandia National Laboratories University of Notre Dame Albuquerque / USA Benjamin Williams University of California / Naval Research Laboratory / University of Cambridge / UK Yeshaiahu Fainman Berthold E. Schmidt University of California / UK Jay Harris George W. Turner San Diego State University MIT Lincoln Laboratory / RUSSIA Bernd Witzigmann University of Kassel Kassel / Nozay Universität Würzburg University of Surrey Nozay / Massachusetts Institute of Technology / Rice University / Ghent University / University of Wisconsin-Madison / /
IndustryTerm
simulation tools / selective and real-time gas sensors / gas-sensing applications / field deployable gas sensors / slow-light devices / carrier lifetime / real world applications / industrial manufacturing / packaging solutions / optoelectronic devices / manufacturing / diode laser technology / difference-frequency generation technology / compact trace gas sensors / power systems / energy meters / biomedical applications / Narrow ridge devices / bench-top analysis applications / energy renormalization modifications / light emitting devices / laser chips / baseline correction algorithm / gas analyzers / trace gas species / carrier leakage / /
Movie
SANTA FE 3 / /
OperatingSystem
Microsoft Vista / /
Organization
University of California / Tsinghua University University / C. S. Kim¸ US Naval Research Laboratory / USA Luke J. Mawst University of WisconsinMadision Madison / Technische Universität München / University of Tokyo / Rice University / Massachusetts Institute of Technology / 23rd International Semiconductor Laser Conference CONFERENCE COMMITTEE / Eindhoven University of Technology / Stony Brook University / JAPAN ORGANIZING COMMITTEE / Universität Würzburg / RUSSIA Bernd Witzigmann University of Kassel Kassel / San Diego State University MIT / British Columbia Rose-Hulman Institute of Technology Vancouver / Ltd. Kanazawa Institute of Technology Kokubunji / Nozay Universität Würzburg University of Surrey Nozay / National Chiao Tung University / UK Andrea Fiore Cristina Masoller Peter P. Vasil’ev Eindhoven University / UK TECHNICAL PROGRAM COMMITTEE / California Institute of Technology / Walter Schottky Institut / Cardiff University / Nottingham Court Ottawa / Swiss Federal Institute of Technology Zurich / Ghent University / IEEE Photonics / USA Lukas Chrostowski Paul O. Leisher University / National Laboratories University of Notre Dame Albuquerque / University of Maryland College Park / Southern Methodist University Dallas / USA Fumio Koyama Xuezhe Zheng Tokyo Institute of Technology Oracle Yokohama / University of Illinois / United Nations / Australian National University Tokyo Institute of Techology Canberra / University of Cambridge / Walter Schottky Institute / US Naval Research Laboratory San Jose / USA Constance J. Chang-Hasnain Clifton G. Fonstad Jerry R. Meyer University / University of Notre Dame / Tokyo Institute of Technology / Technology Universidad Politecnica de Cataluña PN Lebedev University Eindhoven / University of British Columbia / University of Wisconsin / /
Person
DAN FORD / DARIUSZ SIENIAWSKI / Jerome Faist / Amnon Yariv / Luke J. Mawst / Sven Höfling / Crystal Lasers / Mauro Bettiati Sven Höfling Stephen / Mariano Troccoli / Gary M. Smith / Mario Paniccia / Stephan Sprengel / Stephen J. Sweeney / Yasu Arakawa / Geza Kurcveil / Kent Choquette (Americas) / John Bowers / Brian Koch / Katsuaki Tanabe / Manoj Kanskar / Fumio Koyama / Jerry Meyer / Park / Peter P. Vasil / Joshua Paul / Yuichi Tohmori / Matt Sysak / Tobias Gründl / Yong-Hee Lee Tsuyoshi Yamamoto / Tim Day / Peter Smowton / Peter Zory / Peter Blood / John C. Connolly / Ray Beausoleil / Walter Schottky / Shuji Nakamura / Tom Koch / Richard Jones / Gary Evans / John Connolly / A. H. Quarterman / V / Microring Lasers / Di Liang / Alexander Andrejew / Norbert Lichtenstein / XIN WANG / / /
Position
Chair / ISRAEL ASIA AND AUSTRALIA / RT / Professor / General Chair / MIDDLE EAST Chair / Program Chair / Session Chair / GENERAL AND PROGRAM CHAIR / leader / Chair / achieved RT / /
Product
Laser / /
ProgrammingLanguage
DC / FL / /
ProvinceOrState
Monmouth / California / Arizona / Bavaria / Wisconsin / Massachusetts / British Columbia / Florida / /
GENERAL AND PROGRAM CHAIR’S FOREWORD rd Welcome to the 23 IEEE International Semiconductor Laser Conference, ISLC 2012 at the San Diego Mission Valley Marriott on the southern Californian coast. This is of course a spe