NISS Intrinsic Priors for Testing Ordered Exponential Means Dongchu Sun and Seong W. Kim Technical Report Number 99 - Dongchu - Document - PDFSEARCH.IO

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	NISS Intrinsic Priors for Testing Ordered Exponential Means Dongchu Sun and Seong W. Kim Technical Report Number 99 Add to Reading List Document Date: 2004-01-21 15:19:38 Open Document File Size: 230,95 KB Share Result on Facebook Facility National Institute of Statistical Sciences / The University of Missouri / / Organization National Institute of Statistical Sciences / University of Missouri / Columbia / Testing Ordered Exponential Means Dongchu Sun and Seong W. Kim Department of Statistics / / Person Xk / Seong W. Kim / Mj / Mh / Mi / / Position model / correct model / / Product Pentax K-x Digital Camera / / ProvinceOrState Missouri / / Technology simulation / artificial intelligence / / URL www.niss.org / / SocialTag Bayesian inference Prior probability Exponential family Statistics Bayesian statistics Bayes factor

NISS Intrinsic Priors for Testing Ordered Exponential Means Dongchu Sun and Seong W. Kim Technical Report Number 99Add to Reading List