IEEE Std[removed]A Standardized Test Access Methodology for Memory Devices 2011 International Test Conference Heiko Ehrenberg Bob Russell - Ehrenberg - Document - PDFSEARCH.IO

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	IEEE Std[removed]A Standardized Test Access Methodology for Memory Devices 2011 International Test Conference Heiko Ehrenberg Bob Russell Add to Reading List Document Date: 2011-09-27 22:34:31 Open Document File Size: 242,59 KB Share Result on Facebook IndustryTerm compliant device / slave-type devices / / Person Heiko Ehrenberg Bob Russell / / Position device Optional Memory Controller / / Technology NFS example /WE /Write Enable /CS /Chip / / SocialTag Electronics Technology Standards organizations Boundary scan Joint Test Action Group Institute of Electrical and Electronics Engineers Electronics manufacturing IEEE standards Manufacturing

IEEE Std[removed]A Standardized Test Access Methodology for Memory Devices 2011 International Test Conference Heiko Ehrenberg Bob RussellAdd to Reading List