Electrical length

#	Item
91	IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, VOL. 25, NO. 8, AUGUST[removed]Gate-Length Biasing for Runtime-Leakage Control Puneet Gupta, Student Member, IEEE, Andrew B. Kahng, Member Add to Reading List Source URL: nanocad.ee.ucla.edu Language: English - Date: 2010-08-13 22:10:56 Digital electronics Electronic design automation Integrated circuits Logic families MOSFET Subthreshold conduction Leakage CMOS Negative bias temperature instability Electronic engineering Electrical engineering Electromagnetism
92	Capacitor 2x Pulse Length Experiment Add to Reading List Source URL: www.ivorcatt.co.uk Language: English - Date: 2013-10-27 17:48:41 Electromagnetism Electronics Electrical components Test probe Resistor Capacitor Coaxial cable Electrical termination Technology Electronic test equipment Measuring instruments