Contact resistance and TLM measurements In measuring resistance with the four-point-probe or van der Pauw methods, we used 4 contacts (2 for current, 2 for voltage) to determine the sheet resistance of a layer while mini - Electrical measurements - Document - PDFSEARCH.IO

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	Contact resistance and TLM measurements In measuring resistance with the four-point-probe or van der Pauw methods, we used 4 contacts (2 for current, 2 for voltage) to determine the sheet resistance of a layer while mini Add to Reading List Document Date: 2014-04-28 13:00:12 Open Document File Size: 2,04 MB Share Result on Facebook IndustryTerm metal/semiconductor interface / metal / contact metal / electronic devices / / OperatingSystem L3 / / Person Dieter Schroder / John Wiley / / / Position RT / RS RT / / ProgrammingLanguage RC / / Technology semiconductor / / SocialTag Electrical engineering Physical quantities Semiconductors Measurement Sheet resistance Contact resistance Electrical resistance and conductance Resistor Van der Pauw method Electromagnetism

Contact resistance and TLM measurements In measuring resistance with the four-point-probe or van der Pauw methods, we used 4 contacts (2 for current, 2 for voltage) to determine the sheet resistance of a layer while miniAdd to Reading List