| Document Date: 2014-04-24 12:02:15 Open Document File Size: 171,62 KBShare Result on Facebook
City Uccio / New York / / Company Wen L. P. / Wilson / Cambridge University Press / Diebold / / Country United Kingdom / United States / / / Facility UniVersity of Virginia / Hall Model / / IndustryTerm charge carrier concentration / wide and important applications / carrier traps / generated energy / carrier annihilation / rate law / charge carrier recombination kinetics / carrier generation / e-h / carrier recombination / studied metal oxides / energy / Low-energy electron-diffraction / / Organization Cambridge University / UniVersity of Virginia / Defense Threat Reduction Agency / Department of Chemistry / / Person John T. Yates / Jr. / Zhen Zhang / / ProvinceOrState Virginia / / Technology semiconductor / spectroscopy / Recombination / /
SocialTag |