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Date: 2014-11-28 02:45:14Chemistry Focused ion beam Electron microscope Transmission electron microscopy Scanning electron microscope Epoxy Microtome Desiccator Nanoparticle Electron microscopy Scientific method Science | RA-QD02-0032-05_06 Curation data Status Size TransferAdd to Reading ListSource URL: hayabusaao.isas.jaxa.jpDownload Document from Source WebsiteFile Size: 3,92 MBShare Document on Facebook |
Poster: EPOXY—Enabling Robust Protection for Bare-metal Systems Abraham A. Clements∗ , Naif Saleh Almakhdhub† , Khaled S. Saab‡ , Prashast Srivastava† , Jinkyu Koo† , Saurabh Bagchi† , Mathias Payer† ∗DocID: 1xVl5 - View Document | |
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