![Electronic circuits / Scanning probe microscopy / Signal processing filter / Electronic filter / Atomic-force microscopy / Transmission line / Frequency modulation / Amplifier / Piezoresistive effect / Resonance / Lock-in amplifier / JohnsonNyquist noise Electronic circuits / Scanning probe microscopy / Signal processing filter / Electronic filter / Atomic-force microscopy / Transmission line / Frequency modulation / Amplifier / Piezoresistive effect / Resonance / Lock-in amplifier / JohnsonNyquist noise](https://www.pdfsearch.io/img/3e853917f2131c0a28fc6f3f8842ad29.jpg) Date: 2005-07-04 14:48:48Electronic circuits Scanning probe microscopy Signal processing filter Electronic filter Atomic-force microscopy Transmission line Frequency modulation Amplifier Piezoresistive effect Resonance Lock-in amplifier JohnsonNyquist noise | | APPLIED PHYSICS LETTERS 86, 133109 共2005兲 Sensitive detection of nanomechanical motion using piezoresistive signal downmixing I. Bargatin, E. B. Myers, J. Arlett, B. Gudlewski, and M. L. Roukes Condensed Matter PhysAdd to Reading ListSource URL: nano.caltech.eduDownload Document from Source Website File Size: 176,95 KBShare Document on Facebook
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