2262 IEEE TRANSACTIONS ON ELECTRON DEVICES, VOL. 50, NO. 11, NOVEMBER 2003

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Date: 2008-07-30 17:42:24 NQS Electromagnetism MOSFET Field-effect transistor Threshold voltage Spline Linearization Collocation method Current–voltage characteristic Electrical engineering Electronic engineering Mathematical analysis		2262 IEEE TRANSACTIONS ON ELECTRON DEVICES, VOL. 50, NO. 11, NOVEMBER 2003 Add to Reading List Source URL: pspmodel.asu.edu Download Document from Source Website File Size: 830,25 KB Share Document on Facebook

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