First Page | Document Content | |
---|---|---|
Date: 2013-01-06 22:14:17Electronics MOSFET CMOS Field-effect transistor Multiple patterning Dynamic voltage scaling International Electron Devices Meeting Electronic engineering Logic families Technology | Microsoft PowerPoint - NNINsymposium.feb12 [Compatibility Mode]Add to Reading ListSource URL: www.nanotech.ucsb.eduDownload Document from Source WebsiteFile Size: 2,78 MBShare Document on Facebook |