Effects of nonlinear diode junction capacitance on the nose-to-nose calibration - IEEE Microwave and Wireless Components Letters [see also IEEE Microwave and Guided Wave Letters] - Electronic nose - Document - PDFSEARCH.IO

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	Effects of nonlinear diode junction capacitance on the nose-to-nose calibration - IEEE Microwave and Wireless Components Letters [see also IEEE Microwave and Guided Wave Letters] Add to Reading List Document Date: 2007-10-16 15:16:44 Open Document File Size: 56,35 KB Share Result on Facebook City Atlanta / Boston / Brussels / / Company Agilent Technologies Inc. / HP / / Country Belgium / United States / / Facility National Institute of Standards and Technology / / IndustryTerm linear network / WIRELESS COMPONENTS LETTERS / / Organization National Institute of Standards and Technology / RF Technology Division / U.S. Government / / Person Arvind Sharma / Donald C. DeGroot / Dylan F. Williams / John Kerley / Jan Verspecht / / Position Realistic samplingcircuit model / Editor / sampling head / ” IEEE Trans / / ProvinceOrState Georgia / Massachusetts / Colorado / / PublishedMedium IEEE Spectrum / / Technology MICROWAVE / broadband / SIMULATION / / SocialTag Electronic test equipment Measuring instruments Electrical circuits Diode Small-signal model Capacitor Oscilloscope Capacitance Large-signal model Electromagnetism

Effects of nonlinear diode junction capacitance on the nose-to-nose calibration - IEEE Microwave and Wireless Components Letters [see also IEEE Microwave and Guided Wave Letters]Add to Reading List