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Date: 2013-09-24 02:37:46Chemistry Matter Crystallographic defects Optical materials Superhard materials Nitrides Gallium nitride Light-emitting diode Quantum efficiency Dislocation IQE Stacking fault | Enhanced light output power and growth mechanism of GaN-based light-emitting diodes grown on cone-shaped SiO2 patterned template. 學生:陳政勤 學號:Add to Reading ListSource URL: diamondprj.nctu.edu.twDownload Document from Source WebsiteFile Size: 868,25 KBShare Document on Facebook |