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Scanning probe microscopy / Materials science / Electricity / Physical quantities / Quantum electronics / Quantum dot / Electrostatic force microscope / Capacitor / Atomic force microscopy / Chemistry / Physics / Science


VOLUME 83, NUMBER 23 PHYSICAL REVIEW LETTERS
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Document Date: 2002-08-01 15:57:26

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File Size: 573,80 KB

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City

London / /

Company

Dx Semiconductor / M. E. Schmidt S. A. / Ge / Bell Laboratories / /

Country

Columbia / /

Currency

pence / USD / /

Facility

A. Mews / Columbia University / /

IndustryTerm

metal / Dilute hexane solutions / metal substrate / carrier trapping / photovoltaic devices / quantum devices / charge carrier lifetimes / power law dependence / /

Organization

Louis E. Brus Department of Chemistry / W. M. Keck Foundation / American Physical Society / National Science Foundation / Columbia University / New York / /

Person

Todd D. Krauss / Louis E. Brus / George Flynn / /

Position

Professor / /

ProgrammingLanguage

C / /

ProvinceOrState

New York / /

PublishedMedium

PHYSICAL REVIEW LETTERS / /

Technology

semiconductor / quantum dots / laser / optical fiber / dielectric / /

SocialTag