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Ellipsometry
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#	Item
1	Spectroscopic ellipsometry investigation of amorphous carbon films Add to Reading List Source URL: www.manfred.maitz-online.de Language: English - Date: 2006-01-08 12:30:01
2	1 Graduate Creative Activities and Research Forum April 5th, 2016 Southern Illinois University Carbondale Add to Reading List Source URL: curca.siu.edu Language: English - Date: 2016-07-30 02:56:51 Chemistry Polymer chemistry Spectroscopy Polydimethylsiloxane Silicones Siloxanes Polymer Physical chemistry Ellipsometry Carbondale Matter
3	2007 Annual Report nasdaq \| rtec DE A R FE L LOW SH A R EHOL DER S The past year was a challenging one, as semiconductor device manufacturers over-estimated demand, particularly for Add to Reading List Source URL: www.tamartechnology.com Language: English - Date: 2012-05-14 11:44:47 Semiconductor device fabrication Rudolph Technologies Inc. Electromagnetic radiation Business Electronic engineering Ellipsometry Wafer Reliability Immersion lithography Automated X-ray inspection Reflectometry KLA-Tencor
4	UNITED STATES SECURITIES AND EXCHANGE COMMISSION WASHINGTON, D.C_____________________________ FORM 10-K Add to Reading List Source URL: www.tamartechnology.com Language: English - Date: 2015-04-28 13:04:29 Semiconductor device fabrication Rudolph Technologies Inc. Wafer Photolithography Stepper Three-dimensional integrated circuit Automated X-ray inspection Ellipsometry Integrated circuit KLA-Tencor
5	PHYSICAL REVIEW A 70, Quantum ellipsometry using correlated-photon beams Kimani C. Toussaint, Jr.,1 Giovanni Di Giuseppe,1 Kenneth J. Bycenski,1 Alexander V. Sergienko,1,2,* Bahaa E. A. Saleh,1 and Malvin Add to Reading List Source URL: people.bu.edu Language: English - Date: 2004-08-09 18:00:16
6	Labnote - Reflectometry Measurements on a STADI MP Add to Reading List Source URL: www.stoe.com Language: English - Date: 2014-06-02 13:52:20 Matter Thin films Reflectometry Ellipsometry Nature Crystalline silicon Amorphous solid Chemistry
7	Project Title: Project Short description High numerical aperture (NA) spectroscopic imaging ellipsometry: Optical Modelling The Applied Nano-Optics laboratory at the INL deploys one of the world’s Add to Reading List Source URL: inl.int Language: English - Date: 2014-09-12 11:21:33
8	MATEC Web of Conferences 4, DOI: matecconf C Owned by the authors, published by EDP Sciences, 2013 Add to Reading List Source URL: cea-proceedings.edpsciences.org Language: English Molecular electronics Physics Conductive polymers Doping Ellipsometry Semiconductor Organic electronics Tetracyanoquinodimethane Anthracene Organic semiconductors Electronics Chemistry
9	Optical Monitoring of Thin-films Using Spectroscopic Ellipsometry Dale E. Morton, Denton Vacuum, LLC, Moorestown, NJ Blaine Johs and Jeff Hale, J.A. Woollam Co., Inc., Lincoln, NE. Key Words: in-situ monitoring Add to Reading List Source URL: dentonvacuum.com Language: English - Date: 2013-04-08 22:29:24
10	Master Thesis Project: Metrology for the manufacturing of thin films Have you ever seen a real hologram? Do you know how to make one? Do you want to build a new set up and measure on various sample to get a 3D rendering Add to Reading List Source URL: www.tnw.tudelft.nl Language: English - Date: 2012-04-02 06:06:20 Thin film Metrology Measurement Ellipsometry

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