![Optics / Ellipsometry / Ultraviolet / Refractive index / Monochromator / Fourier transform infrared spectroscopy / Spectroscopy / Electromagnetic radiation / Measurement Optics / Ellipsometry / Ultraviolet / Refractive index / Monochromator / Fourier transform infrared spectroscopy / Spectroscopy / Electromagnetic radiation / Measurement](https://www.pdfsearch.io/img/a546eb997590fc5029371d1870d53468.jpg)
| Document Date: 2015-02-04 09:11:39 Open Document File Size: 334,71 KBShare Result on Facebook
Country Germany / / / / IndustryTerm energy loss function / layer-substrate systems / energy range / dielectric layer systems / / Organization Unique Test Facilities Chapter / / Person Uwe Beck / Andreas Hertwig / / / Technology laser / pdf / Dielectric / semiconductors / /
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