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Electron microscopy / Diffraction / Spectroscopy / Electron backscatter diffraction / Semiconductor devices / Crystallography / Reliability engineering / Transistor / Physics of failure / Scientific method / Science / Physics


Microsoft Word - DMEA Article_PoF_.doc
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Document Date: 2009-06-10 10:58:32

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File Size: 28,46 KB

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IndustryTerm

metal / individual chips / particular chip / quality control technology / metal ions / /

Organization

Department of Defense / /

Person

Gary Gaugler / J.T. Long / /

Position

Technical Advisor / freelance writer and editor / /

ProvinceOrState

California / /

PublishedMedium

Engineering News-Record / /

Technology

Forecasting Failure Determining Chip / particular chip / cellular telephone / X-ray / quality control technology / /

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