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Scanning electron microscope / Focused ion beam / Electron microscope / Environmental scanning electron microscope / Electron backscatter diffraction / Failure analysis / Nanoparticle / Porosity / Microscope / Scientific method / Science / Electron microscopy


SEM Technology Advances Energy Research
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Document Date: 2013-07-31 11:10:02

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File Size: 165,47 KB

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City

Peabody / /

Company

Erdman* Naoki Kikuchi* Regina Campbell* Vernon E. Robertson* JEOL USA Inc. / Natasha Erdman JEOL USA Inc. / /

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IndustryTerm

ward imaging / natural gas / ion beam specimen preparation device / metal particles / oil shale / energy research / electricity / nanometer metal particles / organic chemical compounds / oil / gas extraction / unprecedented imaging / imaging / gun technologies / manufacturing side / energy / /

Organization

Electronic Device Failure Analysis Society / /

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Position

cross-section polisher / Cross Section Polisher / /

ProvinceOrState

Massachusetts / /

PublishedMedium

ADVANCED MATERIALS / /

Technology

FEG-SEM technology / gun technologies / fuel cells / /

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