Hyperuniformity in amorphous silicon based on the measurement of the infinite-wavelength limit of the structure factor R. Xie1, - Executive Intelligence Review - Document - PDFSEARCH.IO

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Date: 2017-05-05 20:54:40		Hyperuniformity in amorphous silicon based on the measurement of the infinite-wavelength limit of the structure factor R. Xie1,#, G. G. Long1,2, S. J. Weigand3, S. C. Moss4,‡, T. Carvalho5, S. Roorda5, M. Hejna6, S. To Add to Reading List Source URL: physics.princeton.edu Download Document from Source Website File Size: 668,45 KB Share Document on Facebook