<--- Back to Details
First PageDocument Content
Professional studies / Business / Management / Economy / Failure / Survival analysis / Quality management / Reliability engineering / Service recovery / Service quality / Loyalty business model / Value proposition
Date: 2016-01-20 14:53:02
Professional studies
Business
Management
Economy
Failure
Survival analysis
Quality management
Reliability engineering
Service recovery
Service quality
Loyalty business model
Value proposition

RESEARCH ARTICLE AN EXPLORATORY STUDY OF THE FORMATION AND IMPACT OF ELECTRONIC SERVICE FAILURES Chee-Wee Tan Department of IT Management, Copenhagen Business School, Howitzvej 60,

Add to Reading List

Source URL: www.misq.org

Download Document from Source Website

File Size: 515,67 KB

Share Document on Facebook

Similar Documents

Improving the Reliability of Commodity Operating Systems Michael M. Swift, Brian N. Bershad, and Henry M. Levy Department of Computer Science and Engineering University of Washington Seattle, WAUSA {mikesw,bershad

Improving the Reliability of Commodity Operating Systems Michael M. Swift, Brian N. Bershad, and Henry M. Levy Department of Computer Science and Engineering University of Washington Seattle, WAUSA {mikesw,bershad

DocID: 1vkXP - View Document

International Journal of Advances in Science Engineering and Technology, ISSN: Volume- 2, Issue-4, OctA STRATEGY FOR RELIABILITY EVALUATION AND FAULT DIAGNOSIS OF AUTONOMOUS UNDERWATER GLIDING ROBOT

International Journal of Advances in Science Engineering and Technology, ISSN: Volume- 2, Issue-4, OctA STRATEGY FOR RELIABILITY EVALUATION AND FAULT DIAGNOSIS OF AUTONOMOUS UNDERWATER GLIDING ROBOT

DocID: 1urDX - View Document

Veena Misra Professor of Electrical and Computer Engineering North Carolina State University Optimizing Performance and Reliability of GaN MOSFET Devices Owing to a high critical electric field and high electron mobility

Veena Misra Professor of Electrical and Computer Engineering North Carolina State University Optimizing Performance and Reliability of GaN MOSFET Devices Owing to a high critical electric field and high electron mobility

DocID: 1ukgt - View Document

5 Metrics You Should Know to Understand Your Engineering Efficiency Increase the speed and reliability of your team by understanding these key indicators

5 Metrics You Should Know to Understand Your Engineering Efficiency Increase the speed and reliability of your team by understanding these key indicators

DocID: 1u7ws - View Document

Practical Reliability Engineering for Semiconductor Equipment Daniel J. Weidman, Ph.D. Advanced Electron Beams, Wilmington, MA IEEE Boston-area Reliability Society Meeting

Practical Reliability Engineering for Semiconductor Equipment Daniel J. Weidman, Ph.D. Advanced Electron Beams, Wilmington, MA IEEE Boston-area Reliability Society Meeting

DocID: 1tIgr - View Document