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Article pubs.acs.org/JACS Defining the Value of Injection Current and Effective Electrical Contact Area for EGaIn-Based Molecular Tunneling Junctions Felice C. Simeone, Hyo Jae Yoon, Martin M. Thuo, Jabulani R. Barber,
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Document Date: 2014-01-27 11:30:01

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File Size: 643,02 KB

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City

Cambridge / /

Company

SAMs / Simmons / /

Country

United States / /

Event

Reorganization / FDA Phase / Company Expansion / /

Facility

Stable Contacts / Tunnel Decay Factor / Harvard University / /

IndustryTerm

metal / insoluble multilayer metal thiolate / unstressed systems / rough metal substrate / hot metal atoms / n-alkyl / different terminal groups / metal oxides / template-stripped metal surfaces / metalmakes / as-dep liquid metal liquid / different molecular systems / metal substrate / even-numbered carbon chains / attractive technology / metal substrates / low interfacial free energy / alkyl chain / clean metal substrate / /

OperatingSystem

Fermi / /

Organization

Harvard University / African Union / George M. Whitesides* Department of Chemistry and Chemical Biology / /

Person

Martin M. Thuo / Felice C. Simeone / Hyo Jae Yoon / Jabulani R. Barber / Barbara Smith / George M. Whitesides / /

/

Product

Ga2O3/EGaIn / Tunnel Injection / FeTS/Fe2O3 / Fe2O3 / /

ProgrammingLanguage

R / C / /

ProvinceOrState

Massachusetts / /

PublishedMedium

Journal of the American Chemical Society / /

Technology

V.34 / 3/20 protocol / Si chip / particularly attractive technology / /

SocialTag