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Digital signal processing / Electromagnetism / Analog circuits / Flash ADC / Analog-to-digital converter / Delta-sigma modulation / Successive approximation ADC / Comparator / Fault injection / Electronic engineering / Electronic circuits / Electronics


1 Fault Sensitivity Analysis and Reliability Enhancement of Analog-to-Digital Converters Mandeep Singh, Member, IEEE, and Israel Koren, Fellow, IEEE
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Document Date: 2011-01-27 16:46:18

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File Size: 327,43 KB

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Austin / /

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Input(V) SA / Advanced Micro Devices / /

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United States / /

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Product Issues / /

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University of Massachusetts / /

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medium-to-low speed applications / data acquisition systems / actual hardware / biomedical applications / avionics applications / avionic and biomedical applications / fabrication technologies / binary search algorithm / /

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L3 / /

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Department of Electrical and Computer Engineering / SA ADC / National Science Foundation / US Federal Reserve / University of Massachusetts / Amherst / ARE MRE / /

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designer / Representative / /

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Pentax K-x Digital Camera / Bit2 Bit1 readout Injection / Node / /

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R / C / C* / /

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Texas / Massachusetts / /

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Alpha / radiation / ADC / fabrication technologies / binary search algorithm / simulation / flash / /

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