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| | Characterization of CZT Crystals with Using of the Time-of-Flight Method V. Ivanov, L. Alekseeva, P. Dorogov, A. Loutchanski RITEC Ltd. 23 Aizkraukles St. office 407, Riga, LV-1006, Latvia Tel./Fax: +, E-mail:Add to Reading ListSource URL: www.ritec.lvDownload Document from Source Website File Size: 383,73 KBShare Document on Facebook
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